Low-Dose Imaging Techniques for Transmission Electron Microscopy

نویسندگان

  • David B. Carlson
  • James E. Evans
چکیده

Transmission electron microscopes have the ability to visualize almost any specimen at the nanoscale. Unfortunately, modified imaging protocols are needed when samples are composed predominantly of low atomic number elements. In this chapter we review several methods that are currently employed to mitigate the adverse effects caused by electron irradiation to materials at the interface of biology and nanotechnology. We also highlight future technological advancements to the microscope platform that may further enhance the quality of imaging for beam sensitive samples.

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تاریخ انتشار 2012